iowarp/characterization
Materials characterization method: X-ray CT and porosity, surface roughness and optical profilometry, fractography, and cross-technique defect synthesis, with the characterization_expert subagent.
Combine XCT, fractography, and microstructural evidence into one defect population/root-cause finding rather than reporting each technique's result in isolation.
Read a fracture surface systematically for initiation site, crack-growth features, and final-fracture region before attributing a cause.
Configure an optical profilometer for the surface being measured and know where the technique's own artifacts can bias a roughness or topography result.
Attach a roughness value to the specific parameter, cutoff length, and measurement method that define it, since roughness numbers are not comparable without them.
Connect XCT acquisition and segmentation choices to what the resulting pore and defect statistics can support, classify porosity by formation mechanism, and report size and location distributions rather than one volume fraction.