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iowarp/characterization

v0.6.0BSD-3-Clause

Materials characterization method: X-ray CT and porosity, surface roughness and optical profilometry, fractography, and cross-technique defect synthesis, with the characterization_expert subagent.

optical-profilometry

Configure an optical profilometer for the surface being measured and know where the technique's own artifacts can bias a roughness or topography result.

Read SKILL.md at the source

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