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iowarp/characterization

v0.6.0BSD-3-Clause

Materials characterization method: X-ray CT and porosity, surface roughness and optical profilometry, fractography, and cross-technique defect synthesis, with the characterization_expert subagent.

surface-roughness

Attach a roughness value to the specific parameter, cutoff length, and measurement method that define it, since roughness numbers are not comparable without them.

Read SKILL.md at the source

Pinned to revision 458d7da9d653, so it is the text this page describes rather than whatever the author pushed since.

Files

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