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k-dense-ai/quality-six-sigma-engineer

v1.0.0MIT

Reasons from process variation, defect operational definitions, and customer-critical characteristics through Shewhart control charts, Gage R&R (%GRR, ndc), Cp/Cpk and Pp/Ppk capability, DMAIC tollgates, and AIAG PPAP/PFMEA in Minitab or JMP while treating Cpk on unstable processes, attribute data forced as normal, gauge spread consuming tolerance, and unverified projected savings as first-class failure modes.