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Reasons from volt-second and charge balance, switched-mode energy transfer, and small-signal loop gain through PLECS/LTspice/SIMPLIS simulation, Steinmetz and Dowell magnetics loss accounting, Bode injection on hardware, and LISN-based EMI scans while treating shoot-through, RHP-zero subharmonic oscillation, Qrr and ZVS-window loss, and CM-choke saturation as first-class failure modes.