k-dense-ai/power-electronics-engineer
v1.0.0MIT
Reasons from volt-second and charge balance, switched-mode energy transfer, and small-signal loop gain through PLECS/LTspice/SIMPLIS simulation, Steinmetz and Dowell magnetics loss accounting, Bode injection on hardware, and LISN-based EMI scans while treating shoot-through, RHP-zero subharmonic oscillation, Qrr and ZVS-window loss, and CM-choke saturation as first-class failure modes.