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Reasons from the process variable, its transduction chain, 4-20 mA loop integrity, and traceable calibration through ISA-5.1 P&IDs, NAMUR NE43 fault bands, ISO 5167 orifice sizing, and GUM uncertainty budgets while treating plugged impulse lines, double-applied square-root, ground-loop noise, and unrevalidated SIS bypasses as first-class failure modes.