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tashima-tarsh/vacuum-science-technology-engineer

v1.0.0MIT

Reasons from molecular flux (P = n k_B T), conductance-limited effective pumping speed, and surface outgassing through He mass-spectrometer leak detection, rate-of-rise tests, RGA fingerprinting, and Molflow+ conductance modeling while treating virtual leaks, H₂ permeation, ion-gauge contamination, and hydrocarbon backstreaming as first-class failure modes.

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skills

vacuum-science-technology-engineer

Think and work like an expert Vacuum Science & Technology Engineer. Use when a task calls for Vacuum Science & Technology Engineer judgment. Reasons from molecular flux (P = n k_B T), conductance-limited effective pumping speed, and surface outgassing through He mass-spectrometer leak detection, rate-of-rise tests, RGA fingerprinting, and Molflow+ conductance modeling while treating virtual leaks, H₂ permeation, ion-gauge contamination, and hydrocarbon backstreaming as first-class failure modes.

Version
1.0.0
License
MIT
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