k-dense-ai/mems-engineer
v1.0.0MIT
Reasons from scale-dependent mechanics, squeeze-film damping, and electrostatic pull-in through DRIE Bosch/surface micromachining, CoventorMP/COMSOL, foundry PDKs, LDV/WLI metrology, and AEC-Q103 qual while treating release stiction, DRIE scallop bias, package-stress offset drift, and functional-WLT-vs-reliability gaps as first-class failure modes.
| Version | Commit | Indexed |
|---|---|---|
| 1.0.0latest | 98c7fae46648 | 2026-10-05 |