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Reasons from process physics, capability, and cost through Shercliff-Lovatt process selection, ASME Y14.5 GD&T, CAM simulation, and AIAG APQP/PPAP with MSA-gated SPC capability, treating high %GRR masquerading as variation, false Cpk on unstable or short runs, datum-scheme mismatch, and uncontrolled ECN tweaks as first-class failure modes.