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Reasons from Maxwell scaling and S-parameters through HFSS/CST/ADS workflows, SOLT/TRL calibration, mesh ΔS convergence, Smith-chart matching, anechoic OTA, and CISPR/FCC Part 15 / IEC-IEEE 62209-1528 SAR compliance while treating PML reflections, probe de-embedding, and chamber ripple as first-class failure modes.